The ZEISS aSTEM Detector enhances image quality on FE-SEMs by adding high-resolution electron imaging, practical for both biological and solid-state specimens. It enables versatile imaging with reduced sample damage, supporting various contrast mechanisms for superior analysis outcomes.
Enhance FE-SEM with ZEISS aSTEM Detector for High-Resolution Imaging
Key Takeaways
- Enhances FE-SEM with high-resolution electron imaging.
- Switch between scanning and transmission modes for versatility.
- Supports contrast mechanisms with optimized diode geometry.
- Reduces sample damage to preserve specimen integrity.
- Applicable to ultra-thin biological and solid-state samples.
Increased image quality
thanks to higher resolution
Add transmitted electron imaging capability to your FE-SEM or Crossbeam system. Get additional information out of your ultra-thin biological
or solid-state specimens without the need to use a dedicated Transmission Electron Microscope.
Enjoy flexibility and versatility: Switch between conventional scanning and high-spatial-resolution transmission imaging mode and benefit
from various contrast mechanisms in transmission imaging, thanks to optimized diode geometry and segmentation.
Larger throughput and reduced sample damage are key factors to reduce analysis costs and to ensure information integrity.
Dark-Field image of asbestos. On the left Oriented Dark-Field (ODF) image captured with the ZEISS aSTEM 4-Channel Detector. Thanks to the symmetric
design of the DF detector sectors, the ODF image contains real information about bending and lattice defects within each fiber (right).
EN_43_012_039 | CZ-12/2020 | Design, scope of delivery and technical progress subject to change without notice. | © Carl Zeiss Microscopy GmbH
Not for therapeutic use, treatment or medical diagnostic evidence. Not all products are available in every country. Contact your local ZEISS representative for more information.
this reflects the point symmetry of diffraction patterns and enables
