Discover the ZEISS Sigma, offering high-resolution field emission scanning electron microscopes (FE-SEM) for nano-analysis. With options for various detectors and excellent resolution at low voltages, Sigma facilitates imaging of diverse samples from materials to biological specimens.
Explore Cutting-Edge Nano-Analysis with ZEISS Sigma
Key Takeaways
- Research focus: High-resolution imaging technology with ZEISS Sigma.
- Model system: Various samples, including biological, materials, geological specimens.
- Research goal: Improve SEM workflow efficiency and image quality.
- Presented by: ZEISS product overview on Sigma FE-SEM capabilities.
- Content type: Product Overview for advanced SEM imaging
Enter the World of Reliable, High-End, Nano-Analysis. The ZEISS Sigma family of field emission scanning electron microscopes allows you to structure your routines for imaging and analysis and increase productivity with Sigma’s intuitive workflow. You’ll capture more data, faster than ever before. Make no compromises in high resolution imaging – go to low voltages and benefit from enhanced resolution and contrast at 1 kV or below. Choose from a variety of detector options to tailor Sigma precisely to your applications: you can study all kinds of samples no matter whether they are new materials
under development, particles for quality inspection or biological or geological specimens. Take advantage of variable pressure (VP) imaging to achieve excellent images and analytics on non-conductors with NanoVP lite,
