ZEISS Xradia CrystalCT® computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.

DCT on a microCT brings the ability to image single-phase polycrystalline materials within reach of technical and industrial research labs, covering a wide range of metal, mineral, ceramic, semiconductor, and pharmaceutical samples in 3D. The purpose-built ZEISS Xradia CrystalCT incorporates precisely designed aperture and beam stop assemblies to harness divergent, polychromatic X-ray beams to illuminate a region of interest and increase sensitivity to weaker diffraction signals of polycrystalline samples.

_{Al-4wt%Cu sample with gauge section dimension of (length) 1.25 mm, (width) 1.0 mm and (thickness) 0.5 mm. Sample scanned using helical phyllotaxis HART}

ZEISS Xradia CrystalCT advances materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes. Innovative DCT acquisition modes remove the limitations for larger sample sizes, providing you with the ability to research more sample types. Seamless large volume grain mapping enables scanning samples faster and with more accurate representation of data.

_{Achieve superior sample representivity to create high fidelity computational models}

ZEISS leverages its powerful Xradia technology to deliver world-leading performance on a microCT. With a robust stage, flexible software-controlled source/sample/detector positioning, and a large array detector, you will obtain high-quality, high-resolution scans with best-in-class contrast. ZEISS Xradia CT imaging systems consistently surpass expectations of what a microCT can achieve.

_{Schematic illustration of CrystalCT projection geometry. CrystalCT delivers dual modalities: absorption contrast tomography and diffraction contrast tomography}

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  ✓ Complementary information from high resolution absorption contrast tomography and non-destructive 3D grain mapping delivering size, shape, orientation, and grain boundary information
  ✓ Non-destructive insights into interior microstructures and overlaid grain maps not visible by surface imaging methods such as optical or scanning electron microscopy
  ✓ Ability to segment and analyze data to obtain quantitative, 3D descriptions of structures and particles
  ✓ 4D imaging through ex situ or in situ experiments to see how materials evolve, evolve, through mechanical load or corrosion

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  ✓ Understand grain size and phase evolution in 3D for insight into alloy performance and its dependence on thermal and mechanical processes.
  ✓ Export real 3D structures for physics simulations: predict materials properties (mechanical, thermal, etc.) or digital rock simulations using non-destructive 3D tomography data imaging, characterization, and modeling of rock cores (up to 4”) with high throughput.
  ✓ High contrast 3D imaging for in situ flow studies or 3D mineralogy.
  

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  ✓ Accommodate a range of sample sizes including large objects in their full 3D context, complementing with 3D grain maps in specific applications.
  ✓ Perform crystallography-based print quality assessment in 3D printed metal parts.
  ✓ High throughput scanning of intact devices with fast time to results.
  ✓ Complement or replace physical cross sectioning and eliminate the need to sacrifice your sample.

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  ✓ Image either stained or unstained hard and soft tissues and biological microstructures with high contrast.
  ✓ Quick, non-destructive verification of sample staining and location of features for subsequent imaging using 3D electron microscopy.

Sample representivity – obtaining large volumes of real data to create high fidelity computational models – has been a challenge for crystallographic imaging.

ZEISS Xradia CrystalCT offers advanced DCT modes that overcome some of the previous challenges of conventional DCT data collection that assumes the ROI in the sample is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample.

ZEISS Xradia CrystalCT advanced diffraction scanning modes include

● Helical Phyllotaxis
Helical phyllotaxis rotation is used for long aspect ratio cylindrical samples.
● Helical Phyllotaxis Raster
Helical phyllotaxis raster is used for samples that are typically wider than the field of view.
● Helical Phyllotaxis HART
Phyllotaxis with high aspect ratio tomography, or HART, solves the problem of flat or plate-like sample imaging.

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  After the first step in your workflow of initial acquisition you can then begin to reconstruct. Load your absorption tomography and your diffraction data into GrainMapper3D. Let it identify potential candidates for grain orientations of a given polycrystal by using back and forward projections.

  An automated, iterative search for grains in the sample volume is your next step. Grain reconstruction results are stored as stacks of slices or volume datasets that contain the full description of the indexed grains. Eventually, share 3D CrystalCT results with your collaborators or customers using the standalone GrainMapper3D Viewer application.
  

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  Your final step is to get out all the information you need in one single file. Shape, orientation and spatial locations of all grains in the sample volume are exported into an open data format.

  Finish your experiment with subsequent analyses using customized software or simulation tools. The advanced indexing routines now support the more complex lower symmetry crystal systems.
  

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  Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

  ● Internal camera for sample viewing
  ● Recipe control (set, save, recall)
  ● Multiple energies
  ● Multiple samples with Autoloader option
  ● Micropositioning capability with a simple mouse click

Artificial intelligence (AI)-driven reconstruction technologies for your ZEISS Xradia systems. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.

Maximize use and minimize user intervention with the optional ZEISS Autoloader. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 sample stations, which can support up to 70 samples, queue, and allow to run all day, or off-shift.

ZEISS Xradia platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.​ Available exclusively through Dragonfly 3D World ZEISS edition offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.