The ZEISS Crossbeam Laser integrates a fs-laser to enhance atom probe tomography (APT) and TEM sample preparation. It speeds up site-specific sample fabrications, enabling rapid and precise atomic-level material analysis.
Revolutionizing Atomic-Level Material Study with ZEISS FIB-SEM
Key Takeaways
Research focus: Advanced site-specific preparation using FIB-SEM and fs-laser.
Technique: Atom probe tomography (APT) and TEM sample preparation.
System: ZEISS Crossbeam Laser with ion-sculptor FIB column.
Research goal: Achieve rapid high-resolution material analysis.
Content type: Technical overview of microscopy innovations.