Discover how ZEISS Crossbeam FIB-SEM offers high throughput and quality for 3D analysis. The system enables precise FIB processing, minimizes sample damage, and supports advanced and automated TEM lamella preparation.
Enhance 3D Analysis with ZEISS Crossbeam
Key Takeaways
- Research focus: FIB-SEM for high-resolution 3D analysis.
- Research goal: 3D tomography, imaging, analytics, and sample preparation
- Content type: Product Overview for advanced FIB-SEM workflows
ZEISS Crossbeam combines the performance of a field emission scanning electron microscope with a precise gallium focused ion beam. Crossbeam gives your 3D work that dynamic edge, whether you are milling, imaging, performing 3D analytics or preparing samples for other techniques like TEM.
Customize your instrument to achieve both high quality and high throughput workflows. Exploit the variable pressure capabilities of Crossbeam 350. Use Crossbeam 550 to prepare your most demanding samples, choosing the chamber size that best suits your samples. Or choose Crossbeam 550 Samplefab
for advanced, fully-automated, unsupervised multi-site TEM lamella preparation. Whether you are working on your own project or in a multi-user facility, as an academic or in an industrial lab - if you’ve set your sights on high impact results, ZEISS Crossbeam is your ideal FIB-SEM for high throughput 3D analysis and sample preparation.
