Explore controlled ECCI imaging on ZEISS FESEM to effectively capture crystallographic defects in bulk samples, eliminating the need for using TEM. Produce quantitative analysis of dislocations, defects, stacking faults, and boundaries.
Crystal Imaging with Electron Channeling Contrast on SEM
Key Takeaways
- Research focus: Imaging crystallographic defects in bulk samples using SEM.
- Technique: cECCI enables detailed defect and deformation characterization.
- Model system: Metal and alloy materials
- Research goal: Eliminate the need for TEM analysis
- Content type: Product Overview highlighting cECCI capabilities.
Image crystallographic defects within bulk samples using you ZEISS scanning electron microscope. Apply the controlled electron channeling contrast imaging technique to analyze crystalline microstructures, achieve the channeling condition within individual grains, and observe and quantify features such as dislocations, stacking faults, and grain boundaries.
By performing the cECCI technique on SEM, researchers can often eliminate the need for producing TEM lamella and requiring TEM analysis to produce this type of microstructural information.
Results from cECCI can help to better understand deformation processes within polycrystalline materials, leading to a better understanding of mechanical properties.
