The ZEISS aBSD Detector enhances signal collection by detecting low-angle backscattered electrons. It features a six-channel setup for diverse contrast insights, supporting both material contrast imaging and 3DSM-based surface reconstruction. This pneumatically controlled detector seamlessly integrates for advanced microscopy applications.
Revolutionize Imaging with ZEISS aBSD Detector
Key Takeaways
- Scientific focus: Backscattered electron detection with the aBSD Detector.
- Model system: No specific biological system indicated.
- Research goal: Enhance imaging contrast and surface topography reconstruction.
- Presented by: ZEISS technical team.
- Content type: Product Overview on advanced microscopy tools.
Enhanced signal collection
and a variety of contrast
The aBSD detector is used to detect backscattered electrons, that have been scattered under very low angles.
In general, this new detector contains six input channels: The inner ring is especially used to image the material contrast as it has a high
take-off angle. The middle ring shows a mixture of material contrast and topography. The outer ring is divided into four segments to explore
This information can be used by 3DSM to reconstruct surface topography. The detector is inserted and retracted pneumatically.
EN_43_012_108 | CZ-07-2020 | Design, scope of delivery and technical progress subject to change without notice. | © Carl Zeiss Microscopy GmbH
Not for therapeutic use, treatment or medical diagnostic evidence. Not all products are available in every country. Contact your local ZEISS representative for more information.
