
Discover how the ZEISS Versa X-ray microscopes provide diffraction contrast tomography (DCT) for crystallographic analysis in polycrystalline materials. DCT offers non-destructive, 3D insights into grain structure and crystallographic orientations, enhancing material characterization.
X-ray tomography has operated under two primary contrast mechanisms for some time: X-ray absorption and phase contrast, which both rely on material density differences within the sample. However, single-phase polycrystalline materials (e.g. steels, alloys, etc.) do not exhibit any significant contrast using absorption or phase mechanisms.
Synchrotron-based XRM has provided results in this area for about a decade with diffraction contrast tomography (DCT), which provides crystallographic/diffraction information from poly-crystalline samples, non-destructively, in 3D. Now, advancing laboratory X-ray microscopy (XRM) one step further, we describe here the capabilities of laboratory- based DCT on the ZEISS Xradia Versa 3D X-ray microscopes, and the new research and characterization capabilities it delivers. The ability to image the grain structure and quantify the crystallographic orientation relationships in such materials is instrumental to a comprehensive understanding of their properties and performance.